The widely differing properties of amorphous carbon films originate fr
om the different s-p hybridization schemes possibly occurring in the C
-C bond For the study of such systems, an approach is suggested that p
rovides direct access to these different types of s-p hybridization vi
a a separate mapping of the s and p partial density of states (DOS) co
ntributing to the total valence band (VB) DOS in carbon materials. Bot
h x-ray and UV-excited VB spectra are needed to this end: the dependen
ce of photoionization cross-sections on photon energy in fact makes x-
ray-excited VB photoemission essentially a probe of the s-DOS, and UV-
excited VB photoemission essentially a probe of the p-DOS. (C) 1998 Jo
hn Wiley & Sons, Ltd.