X-RAY AND UV VALENCE-BAND PHOTOEMISSION OF CARBON-FILMS

Citation
L. Calliari et al., X-RAY AND UV VALENCE-BAND PHOTOEMISSION OF CARBON-FILMS, Surface and interface analysis, 26(8), 1998, pp. 565-568
Citations number
11
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
26
Issue
8
Year of publication
1998
Pages
565 - 568
Database
ISI
SICI code
0142-2421(1998)26:8<565:XAUVPO>2.0.ZU;2-D
Abstract
The widely differing properties of amorphous carbon films originate fr om the different s-p hybridization schemes possibly occurring in the C -C bond For the study of such systems, an approach is suggested that p rovides direct access to these different types of s-p hybridization vi a a separate mapping of the s and p partial density of states (DOS) co ntributing to the total valence band (VB) DOS in carbon materials. Bot h x-ray and UV-excited VB spectra are needed to this end: the dependen ce of photoionization cross-sections on photon energy in fact makes x- ray-excited VB photoemission essentially a probe of the s-DOS, and UV- excited VB photoemission essentially a probe of the p-DOS. (C) 1998 Jo hn Wiley & Sons, Ltd.