BICMOS THERMAL SENSOR CIRCUIT FOR BUILT-IN-TEST PURPOSES

Authors
ALTET J RUBIO A DILHAIRE S SCHAUB E CLAEYS W
Citation
J. Altet et al., BICMOS THERMAL SENSOR CIRCUIT FOR BUILT-IN-TEST PURPOSES, Electronics Letters, 34(13), 1998, pp. 1307-1309
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
34
Issue
13
Year of publication
1998
Pages
1307 - 1309
Database
ISI
SICI code
0013-5194(1998)34:13<1307:BTSCFB>2.0.ZU;2-W
Abstract
New difficulties have arisen in integrated circuit (IC) testing due to trends in technological development. Alternatives to traditional circ uit testing techniques are appearing, such as thermal testing. The aut hors present a new built-in IC-surface differential thermal sensor. Th e sensor, analysis, implementation on a BiCMOS specific integrated cir cuit, and experimental measurements show the viability of temperature sensing for testing purposes.