MUELLER MATRIX FOR CHARACTERIZATION OF ONE-DIMENSIONAL ROUGH PERFECTLY REFLECTING SURFACES IN CONICAL CONFIGURATION

Theoretical results of the use of a Mueller matrix to characterize a o ne-dimensional rough perfectly reflecting, single-scattering surface i n a conical configuration are presented. The conical Mueller matrix (C MM) is derived from the known Mueller matrix of this kind of surface i n the plane of incidence [the plane Mueller matrix (PMM)]. The key arg ument is that, as the PMM is considered to be a Mueller-Jones matrix, an appropriate rotation of the complex amplitude matrix provides the c onic Mueller matrix. (C) 1998 Optical Society of America.