Properties extracted from force curves obtained by atomic force micros
copy (AFM) conducted at various locations on a sample can be mapped to
determine their distribution over the sample surface, that is, force
curve mapping. Since a huge amount of force curve data must be handled
in such mapping, automatic force curve analysis is required. We have
developed an algorithm which makes use of a differentiated force curve
having peaks at the snap-in and snap-out points of the original force
curve and negative values when the AFM tip is in contact with the sam
ple surface. This algorithm was applied to various samples.