X-RAY GRAZING-INCIDENCE DIFFRACTION FROM POLYCRYSTALLINE SB FILMS ON SINGLE-CRYSTAL SUBSTRATES

Citation
E. Findeisen et al., X-RAY GRAZING-INCIDENCE DIFFRACTION FROM POLYCRYSTALLINE SB FILMS ON SINGLE-CRYSTAL SUBSTRATES, Journal of physics. Condensed matter, 5(44), 1993, pp. 8149-8158
Citations number
17
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09538984
Volume
5
Issue
44
Year of publication
1993
Pages
8149 - 8158
Database
ISI
SICI code
0953-8984(1993)5:44<8149:XGDFPS>2.0.ZU;2-X
Abstract
The intensity of Bragg reflections depends strongly on the angle of in cidence, if a highly collimated beam of x-rays is impinging at grazing incidence on a thin (200-600 Angstrom) polycrystalline antimony layer . In the case of asymmetric grazing incidence diffraction (AGID) the a ngle of incidence is small, as the exit angle must be large and nearly twice the Bragg angle. The experimental data are analysed on the basi s of the distorted wave born approximation (DWBA), which yields the th ickness d and the optical constants delta and beta of the layer. These parameters are compared with those determined from total external ref lection data.