ELECTRON-ENERGY-LOSS CHARACTERIZATION OF LASER-DEPOSITED AC, A-CH, AND DIAMOND FILMS

Citation
P. Kovarik et al., ELECTRON-ENERGY-LOSS CHARACTERIZATION OF LASER-DEPOSITED AC, A-CH, AND DIAMOND FILMS, Physical review. B, Condensed matter, 48(16), 1993, pp. 12123-12129
Citations number
18
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
48
Issue
16
Year of publication
1993
Pages
12123 - 12129
Database
ISI
SICI code
0163-1829(1993)48:16<12123:ECOLAA>2.0.ZU;2-C
Abstract
Electron-energy-loss spectroscopy has been used to identify microcryst alline diamond films produced by laser ablation of graphite. The produ ction of the diamond phase results from varying the deposition geometr y and parameters from those of an earlier configuration that produced diamondlike carbon films. A complete study of these crystalline and am orphous materials indicates a plasmon energy variation for films produ ced in different environments. Spectra taken with different primary en ergies show variation in the plasmon energy in hydrogenated carbon fil ms. These changes were interpreted as a variation in the bonding natur e of the sample with depth. The spectra of all samples were analyzed t o determine sp2/sp2+sp3 fraction, dielectric functions, and optical ba nd gap.