Ya. Chulzhanov et al., A SIMPLE DEVICE FOR STUDY OF MATERIALS TRANSPARENT IN THE NEAR IR, Instruments and experimental techniques, 41(3), 1998, pp. 422-423
A device consisting of an optical microscope and an overhead scanner i
s described. The device permits measurements of materials transparent
in the near IR. The capabilities of this method are demonstrated using
the study of the cadmium-telluride structure as an example.