A TENSILE STAGE TO STUDY THIN POLYMER-FILMS IN AN ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE

Authors
THOMAS V WOLFENDEN A
Citation
V. Thomas et A. Wolfenden, A TENSILE STAGE TO STUDY THIN POLYMER-FILMS IN AN ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE, Review of scientific instruments, 69(2), 1998, pp. 463-465
Citations number
7
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
69
Issue
2
Year of publication
1998
Part
1
Pages
463 - 465
Database
ISI
SICI code
0034-6748(1998)69:2<463:ATSTST>2.0.ZU;2-7
Abstract
An economical and easily constructed tensile stage to study thin polym er films in an environmental scanning electron microscope has been dev eloped. Surface features of the film and the morphology in the vicinit y of a crack tip while under stress may be studied using this stage. T he construction, sample mounting technique, and some of the photomicro graphs obtained using this tensile stage have been illustrated and des cribed. (C) 1998 American Institute of Physics.