X-RAY-DIFFRACTION STUDY OF PHASE-TRANSITIONS IN SR0.75BA0.25NB2O6 BETWEEN 20 K AND 400 K

Citation
F. Prokert et al., X-RAY-DIFFRACTION STUDY OF PHASE-TRANSITIONS IN SR0.75BA0.25NB2O6 BETWEEN 20 K AND 400 K, Ferroelectrics. Letters section (Print), 24(1-2), 1998, pp. 1-7
Citations number
15
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
07315171
Volume
24
Issue
1-2
Year of publication
1998
Pages
1 - 7
Database
ISI
SICI code
0731-5171(1998)24:1-2<1:XSOPIS>2.0.ZU;2-H
Abstract
X-ray powder diffraction patterns of the ferroelectric mixed crystal S r0.75Ba0.25Nb2O6 are recorded in Guinier geometry in a temperature ran ge between 20 K and 400 K by means of the film-lift technique, The lat tice parameters were refined for a single tetragonal structure in the whole temperature range ignoring the incommensurate modulation of the structure. The lattice parameter c exhibit strong anomalous temperatur e dependence at 200 K<T<350 K, indicating the diffuse ferroelectric ph ase transition (DPT). The proceeding of the DPT is also detectable by an increase of the diffuse scattering around the (002)-reflection. The temperature dependence of the unit cell volume indicates further PTs below room temperature in this relaxer material.