EXAFS STUDY ON METAL CLUSTER DOPED SILICA GLASS OBTAINED BY ION-IMPLANTATION PROCEDURES

Citation
G. Battaglin et al., EXAFS STUDY ON METAL CLUSTER DOPED SILICA GLASS OBTAINED BY ION-IMPLANTATION PROCEDURES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 141(1-4), 1998, pp. 252-255
Citations number
20
Categorie Soggetti
Instument & Instrumentation","Nuclear Sciences & Tecnology","Physics, Atomic, Molecular & Chemical","Physics, Nuclear
ISSN journal
0168583X
Volume
141
Issue
1-4
Year of publication
1998
Pages
252 - 255
Database
ISI
SICI code
0168-583X(1998)141:1-4<252:ESOMCD>2.0.ZU;2-W
Abstract
Metal-doped glasses were prepared by double ion implantation (Ag+Cu an d Au+Cu) in silica glass. X-ray absorption spectroscopy was used to st udy the different oxidation states of the dopant metals and the possib le formation of metal or alloy clusters. We present an investigation o n co-implanted silica glass at the Cu K, Ag K and An L-III edges. The local atomic order around each dopant was determined. In particular, n o evidence of metal alloying was found. Cu is mainly bound to O atoms of the glass, Ag mainly forms pure metallic clusters and Au is present as small metallic particles and isolated atoms. (C) 1998 Elsevier Sci ence B.V. All rights reserved.