A NOVEL HIGH-RESOLUTION INTERFERENCE SPECTROMETER

Citation
Tl. Helg et al., A NOVEL HIGH-RESOLUTION INTERFERENCE SPECTROMETER, Optics and lasers in engineering, 29(6), 1998, pp. 413-422
Citations number
6
Categorie Soggetti
Optics
ISSN journal
01438166
Volume
29
Issue
6
Year of publication
1998
Pages
413 - 422
Database
ISI
SICI code
0143-8166(1998)29:6<413:ANHIS>2.0.ZU;2-L
Abstract
A novel precision wavemeter is presented with a resolution of better t han 0.01 nm. A Sagnac interferometer with two diffraction gratings for ms the basis of the instrument. Using spatial heterodyning techniques and a CCD camera/frame grabber data acquisition system allows fast com puter control and power spectrum analysis. The mode structure and mode hopping characteristics of a typical laser diode were examined as a f unction of diode injection current. (C) 1998 Elsevier Science Ltd. All rights reserved.