GRADED X-RAY OPTICS FOR SYNCHROTRON-RADIATION APPLICATIONS

Using X-ray diffractometry and spectral measurements, the structure an d properties of graded Xray optical elements have been examined. Exper imental and theoretical data on X-ray supermirrors, which were prepare d by the magnetron sputtering technique using precise thickness contro l, are reported. Measurements on graded aperiodic Si1-xGex single crys tals, which were grown by the Czochralski technique, are also presente d. The lattice parameter of such a crystal changes almost linearly wit h increasing Ge concentration. The measurements indicate that Si1-xGex crystals with concentrations up to 7 at.% Ge can be grown with a qual ity comparable to that of pure Si crystals.