CRYOGENIC HIGH-RESOLUTION X-RAY SPECTROMETERS FOR SR-XRF AND MICROANALYSIS

Citation
M. Frank et al., CRYOGENIC HIGH-RESOLUTION X-RAY SPECTROMETERS FOR SR-XRF AND MICROANALYSIS, Journal of synchrotron radiation, 5, 1998, pp. 515-517
Citations number
15
Categorie Soggetti
Instument & Instrumentation","Physics, Applied",Optics
ISSN journal
09090495
Volume
5
Year of publication
1998
Part
3
Pages
515 - 517
Database
ISI
SICI code
0909-0495(1998)5:<515:CHXSFS>2.0.ZU;2-C
Abstract
Experimental results are presented obtained with a cryogenically coole d high-resolution X-ray spectrometer based on a 141 x 141 mu m Nb-Al-A l2O3-Al-Nb superconducting tunnel junction (STJ) detector in an SR-XRF demonstration experiment. STJ detectors can operate at count rates ap proaching those of semiconductor detectors while still providing a sig nificantly better energy resolution for soft X-rays. By measuring fluo rescence X-rays from samples containing transition metals and low-Z el ements, an FWHM energy resolution of 6-15 eV for X-rays in the energy range 180-1100 eV has been obtained. The results show that, in the nea r future, STJ detectors may prove very useful in XRF and microanalysis applications.