SURFACE X-RAY-SCATTERING SYSTEM AT THE SRRC

Authors
Citation
Ch. Hsu et Mt. Tang, SURFACE X-RAY-SCATTERING SYSTEM AT THE SRRC, Journal of synchrotron radiation, 5, 1998, pp. 896-898
Citations number
8
Categorie Soggetti
Instument & Instrumentation","Physics, Applied",Optics
ISSN journal
09090495
Volume
5
Year of publication
1998
Part
3
Pages
896 - 898
Database
ISI
SICI code
0909-0495(1998)5:<896:SXSATS>2.0.ZU;2-2
Abstract
A UHV surface X-ray scattering system has been constructed at the SRRC , providing users with a state-of-the-art system for performing X-ray scattering studies of two-dimensional crystallography, in situ growth mechanisms as well as phase transitions of surfaces and interfaces. A study of the phase transition of the Si(001) reconstructed surface was conducted to commission both the scattering system and the SRRC X-ray beamline. The detailed design and performance of the SRRC surface X-r ay scattering system together with the results of the Si(001) study ar e presented.