A UHV surface X-ray scattering system has been constructed at the SRRC
, providing users with a state-of-the-art system for performing X-ray
scattering studies of two-dimensional crystallography, in situ growth
mechanisms as well as phase transitions of surfaces and interfaces. A
study of the phase transition of the Si(001) reconstructed surface was
conducted to commission both the scattering system and the SRRC X-ray
beamline. The detailed design and performance of the SRRC surface X-r
ay scattering system together with the results of the Si(001) study ar
e presented.