DEVELOPMENT OF AN IN-SITU X-RAY-DIFFRACTION SYSTEM FOR OBSERVATION OFELECTRODEPOSITION OF METALLIC LAYERS

Citation
M. Imafuku et al., DEVELOPMENT OF AN IN-SITU X-RAY-DIFFRACTION SYSTEM FOR OBSERVATION OFELECTRODEPOSITION OF METALLIC LAYERS, Journal of synchrotron radiation, 5, 1998, pp. 935-936
Citations number
4
Categorie Soggetti
Instument & Instrumentation","Physics, Applied",Optics
ISSN journal
09090495
Volume
5
Year of publication
1998
Part
3
Pages
935 - 936
Database
ISI
SICI code
0909-0495(1998)5:<935:DOAIXS>2.0.ZU;2-F
Abstract
In order to study the dynamic phenomena of electrodeposition of metall ic layers, an in situ X-ray diffraction system has been newly develope d using an electrochemical cell and an image-plate detector. Electrode position of Zn on an Fe(100) single-crystal surface with a current den sity at 0.5 A cm(-2) was demonstrated in this study. Time-resolved dif fraction patterns were obtained by scanning the image plate. It was fo und that Zn(101) layers were mainly formed from the initial stage of d eposition and grew continuously on this substrate. Growth of other lay ers, such as Zn(103), Zn(110) and Zn(102), were also detected. On the other hand, Zn(100) and Zn(002) were not observed under this condition .