DEVELOPMENT OF SCANNING-X-RAY MICROSCOPES FOR MATERIALS SCIENCE SPECTROMICROSCOPY AT THE ADVANCED LIGHT-SOURCE

Authors
WARWICK T ADE H CERASARI S DENLINGER J FRANCK K GARCIA A HAYAKAWA S HITCHCOCK A KIKUMA J KLINGLER S KORTRIGHT J MORISSON G MORONNE M RIGHTOR E ROTENBERG E SEAL S SHIN HJ STEELE WF TONNER BP
Citation
T. Warwick et al., DEVELOPMENT OF SCANNING-X-RAY MICROSCOPES FOR MATERIALS SCIENCE SPECTROMICROSCOPY AT THE ADVANCED LIGHT-SOURCE, Journal of synchrotron radiation, 5, 1998, pp. 1090-1092
Citations number
11
Categorie Soggetti
Instument & Instrumentation","Physics, Applied",Optics
Journal title
Journal of synchrotron radiation → ACNP
ISSN journal
09090495
Volume
5
Year of publication
1998
Part
3
Pages
1090 - 1092
Database
ISI
SICI code
0909-0495(1998)5:<1090:DOSMFM>2.0.ZU;2-2
Abstract
The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will prov ide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a U HV environment.