RAPID PROJECTION OF CRYSTAL GRAIN-ORIENTATION DISTRIBUTION IN ALUMINUM-ALLOY SHEETS BY SYNCHROTRON X-RAY-DIFFRACTION

Citation
K. Kawasaki et al., RAPID PROJECTION OF CRYSTAL GRAIN-ORIENTATION DISTRIBUTION IN ALUMINUM-ALLOY SHEETS BY SYNCHROTRON X-RAY-DIFFRACTION, Journal of synchrotron radiation, 5, 1998, pp. 1139-1140
Citations number
3
Categorie Soggetti
Instument & Instrumentation","Physics, Applied",Optics
ISSN journal
09090495
Volume
5
Year of publication
1998
Part
3
Pages
1139 - 1140
Database
ISI
SICI code
0909-0495(1998)5:<1139:RPOCGD>2.0.ZU;2-G
Abstract
An investigation of the primary recrystallization and the grain growth process of aluminium alloy sheets has been carried out using a method for rapid projection of the crystal grain orientation distribution. I t is found that the projected pattern is continuous in the cold-rolled state. When the sheet is annealed, tiny diffraction spots or small gr ains appear. The addition of Mg greatly alters the sizes and number of grains, and the orientation of the grains in sheets.