Y. Ohtake et al., CHARACTERIZATION OF ZNINXSEY THIN-FILMS AS A BUFFER LAYER FOR HIGH-EFFICIENCY CU(INGA)SE-2 THIN-FILM SOLAR-CELLS, JPN J A P 1, 37(6A), 1998, pp. 3220-3225
The structural, optical and electrical properties of ZnInxSey (ZIS) th
in films on Cu(InGa)Se-2 (CIGS) thin films and glass substrates were c
haracterized. Polycrystalline ZIS thin films were grown by the coevapo
ration method using three constituent elements. We confirmed the forma
tion of ZnIn2Se4 from the X-ray diffraction patterns of the ZIS thin f
ilms on glass substrates. From the transmittance and reflectance measu
rements of these films, the bandgap of ZIS is estimated at around 2.0
cV in this study. In addition, the ZIS films on glass substrates show
low dark conductivity and high photosensitivity, which are suitable fo
r the buffer layer in CIGS thin-film solar cells. We also fabricated t
he CIGS thin-film solar cells with a ZnO/ZIS/CIGS structure, and inves
tigated the relationship between the cell performance and the beam int
ensity ratio of zinc to indium.