STM CHARACTERIZATION OF EXTENDED DISLOCATION CONFIGURATIONS IN AU(001)

Scanning tunneling microscopy (STM) of Au(001) single crystals has bee n used to characterize dislocation configurations resulting mainly fro m nanoindentation of the surface by contact with the STM tip. The Burg ers vectors and directions of the different extended dislocations are identified by comparing STM pictures.with simulated images of the corr esponding atomic configurations. We describe a configuration consistin g of an unfaulted dislocation loop split into two pairs of Shockley pa rtials, linked by a stair-rod segment that holds the two stacking-faul t ribbons. The separation between Shockley partials in the extended di slocations is found to be larger than in the bulk: [S0163-1829(98)0452 7-5].