A three-dimensional reflectance scanning optical microscope based on t
he nonlinear optical phenomenon of second-harmonic generation is prese
nted. A mode-locked Ti:sapphire laser producing <90-fs pulses at simil
ar to 790 nm was used, and the images were constructed by scanning of
an object, which possessed local second-order nonlinearity, relative t
o a focused spot from the laser. The second-harmonic light at similar
to 395 nm generated by the specimen was separated from the fundamental
beam by use of dichroic and interference filters and was detected by
a photodiode. The technique was then used to characterize the distribu
tion of second-order nonlinearity and microstructure of the nonlinear
material lithium triborate. (C) 1998 Optical Society of America.