MEASUREMENT OF SURFACE-ROUGHNESS BY ATOMIC-FORCE MICROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROMETRY OF CDS NANOCRYSTALLINE FILMS

Authors
NANDA KK SARANGI SN SAHU SN
Citation
Kk. Nanda et al., MEASUREMENT OF SURFACE-ROUGHNESS BY ATOMIC-FORCE MICROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROMETRY OF CDS NANOCRYSTALLINE FILMS, Applied surface science, 133(4), 1998, pp. 293-297
Citations number
7
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
Applied surface science → ACNP
ISSN journal
01694332
Volume
133
Issue
4
Year of publication
1998
Pages
293 - 297
Database
ISI
SICI code
0169-4332(1998)133:4<293:MOSBAM>2.0.ZU;2-N
Abstract
Surface roughness of chemically prepared CdS samples of different thic knesses were studied by atomic force microscopy and Rutherford backsca ttering spectrometry. Both the studies qualitatively gave the same rou ghness and were found to increase with increasing thickness. (C) 1998 Elsevier Science B.V. All rights reserved.