ION SOURCES FOR MICROSIZE ION-BEAM TREATMENT OF OPTICAL PARTS

Citation
Ra. Michnev et al., ION SOURCES FOR MICROSIZE ION-BEAM TREATMENT OF OPTICAL PARTS, Review of scientific instruments, 69(2), 1998, pp. 899-901
Citations number
6
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
69
Issue
2
Year of publication
1998
Part
2
Pages
899 - 901
Database
ISI
SICI code
0034-6748(1998)69:2<899:ISFMIT>2.0.ZU;2-R
Abstract
The requirements of ion sources (IS) for ion-beam treatment (IBT) of h igh precision optical parts are substantiated. The ion source feature is presented. There are developed and investigated differences for ion -optical systems forming the beams featuring preset ion current distri bution and cross section (on the 0.1 level) in the range from 5 to 30 mm. The ion beam characteristics are measured. IS has been tested whil e processing different materials. The source is recommended for employ ment in installations designed for automatic microsize processing of h igh precision optical parts. (C) 1998 American Institute of Physics.