LOW-TEMPERATURE PHOTOEMISSION-STUDY OF THE SURFACE ELECTRONIC-STRUCTURE OF SI(111)7X7

Citation
Rig. Uhrberg et al., LOW-TEMPERATURE PHOTOEMISSION-STUDY OF THE SURFACE ELECTRONIC-STRUCTURE OF SI(111)7X7, Physical review. B, Condensed matter, 58(4), 1998, pp. 1730-1733
Citations number
16
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
58
Issue
4
Year of publication
1998
Pages
1730 - 1733
Database
ISI
SICI code
0163-1829(1998)58:4<1730:LPOTSE>2.0.ZU;2-A
Abstract
The electronic structure of the Si(111)7 x 7 surface has been studied in detail at a sample temperature of 55 K with high-energy-resolution angle-resolved photoemission. The photoemission spectra show a previou sly undetected surface-state structure at approximate to 0.5 eV below the Fermi level that we assign to dangling-bend states located mainly to the adatoms near the corner holes of the 7x7 reconstruction. Detail ed dispersion curves obtained at 55 K are presented for the three uppe rmost, dangling-bond derived, surface states. Surface sensitive Si 2p spectra obtained in this low-temperature study still show a comparativ ely broad line shape. Possible reasons for this are discussed.