SILICON INTERBAND-TRANSITIONS OBSERVED AT SI(100)-SIO2 INTERFACES

Authors
Citation
G. Erley et W. Daum, SILICON INTERBAND-TRANSITIONS OBSERVED AT SI(100)-SIO2 INTERFACES, Physical review. B, Condensed matter, 58(4), 1998, pp. 1734-1737
Citations number
21
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
58
Issue
4
Year of publication
1998
Pages
1734 - 1737
Database
ISI
SICI code
0163-1829(1998)58:4<1734:SIOASI>2.0.ZU;2-S
Abstract
We report on a type of Si interband transitions at Si(100)-SiO2 interf aces that has no equivalent in the bulk of crystalline silicon. These transitions, leading to strong resonances in optical second-harmonic-g eneration spectra with energies of 3.6-3.8 eV, are energetically locat ed between the E-1 and E-2 critical points of bulk Si. We assign these transitions to Si atoms without T-d lattice symmetry at the boundary between crystalline Si and the SiOx transition region. We also report on a strong blueshift of the E-2 transitions at the interface.