OPTICAL-CONSTANTS AND GROWTH MODE OF NI FILMS DEPOSITED ON EVAPORATEDAL, AG AND CU FILMS

Information about the optical constants and structures of Ni films in Ni/Al(AlOx. Al), Ni/Ag and Ni/Cu(CuOx. Cu) bilayer systems are obtaine d through an attenuated total reflection (ATR) analysis, scanning elec tron spectroscopy (SEM) observation and the X-ray diffraction measurem ents. In particular, the optical constants of the Ni films are evaluat ed at various stages of growth. It is finally concluded that the Ni fi lms show island growth for the Ni/Al(AlOx. Al) and Ni/CuOx. Cu bilayer s, whereas layer-by-layer growth is found for the Ni films in the Ni/C u system. It is confirmed from SEM images that the Ni him on the Ag hi m shows island growth, but the ATR experimental results indicate that it becomes continuous at a very early stage of growth. (C) 1998 Elsevi er Science B.V. All rights reserved.