X-RAY CHARACTERIZATION OF ZN1-XCOXS SINGLE-CRYSTALS GROWN BY CHEMICAL-VAPOR TRANSPORT

Citation
W. Paszkowicz et al., X-RAY CHARACTERIZATION OF ZN1-XCOXS SINGLE-CRYSTALS GROWN BY CHEMICAL-VAPOR TRANSPORT, Journal of alloys and compounds, 274(1-2), 1998, pp. 128-135
Citations number
56
Categorie Soggetti
Chemistry Physical","Metallurgy & Metallurigical Engineering","Material Science
ISSN journal
09258388
Volume
274
Issue
1-2
Year of publication
1998
Pages
128 - 135
Database
ISI
SICI code
0925-8388(1998)274:1-2<128:XCOZSG>2.0.ZU;2-5
Abstract
Single Zn1-xCoxS crystals with x up to about 0.285 were grown by the c hemical vapour transport method using iodine as the transporting agent . The obtained single crystal grains were typically of up to 3-6 mm in size. The crystal quality was studied with the help of high-resolutio n diffractometry. The FWHM of rocking curves was of the order of 40''. Lattice constants measured by both, the powder diffractometry and hig h-resolution diffractometry, are reported and compared with the litera ture data. The extrapolated lattice constant for hypothetical CoS comp ound of sphalerite-type structure is 5.343(1) Angstrom. The interatomi c distances in Zn1-xCoxS and in related Fe and Mn containing sulphides are briefly discussed. (C) 1998 Elsevier Science S.A.