RELAXATION OF ELECTRONIC EXCITATIONS IN CSI CRYSTALS STUDIED BY SYNCHROTRON-RADIATION AND PULSED ELECTRONS

Citation
M. Kirm et al., RELAXATION OF ELECTRONIC EXCITATIONS IN CSI CRYSTALS STUDIED BY SYNCHROTRON-RADIATION AND PULSED ELECTRONS, Radiation measurements, 29(3-4), 1998, pp. 257-261
Citations number
24
Categorie Soggetti
Nuclear Sciences & Tecnology
Journal title
ISSN journal
13504487
Volume
29
Issue
3-4
Year of publication
1998
Pages
257 - 261
Database
ISI
SICI code
1350-4487(1998)29:3-4<257:ROEEIC>2.0.ZU;2-N
Abstract
The luminescence properties of CsI crystals have been investigated usi ng a pulsed 300 keV electron beam, VUV photons from a bending magnet a nd soft X-ray synchrotron radiation from an undulator source. The emis sion spectra of CsI crystals in the temperature range 8-300 K, excited by photons of 55-500 eV, were investigated. The intrinsic self-trappe d exciton (STE) emissions at 3.7 and 4.3 eV were observed at 8 K, as w ell as the intrinsic 4.1 eV emission and some extrinsic emissions tit 300 K. The fast emission band (1.8-2.7 eV), observed by the electron b eam irradition of CsI at 80 K, is assigned to the transitions between Cs+ 5p cation subbands. (C) 1998 Elsevier Science Ltd. All rights rese rved.