The preparation of carbon nitride thin films by ablation of different
target compounds (graphite, guanazole) in a reactive atmosphere of amm
onia with an ArF excimer laser (193 nm) is reported. The films were de
posited on different substrates (silicon wafers and aluminium plates)
and were analysed with different techniques such as profilometry, Four
ier transform infrared (FTIR) and energy dispersive X-ray spectroscopy
(EDX). For both targets, a comparative study of the influence of the
ammonia total pressure on the growth rate, composition and properties
of the obtained material has been done. A gradual nitrogen incorporati
on in the films with increasing ammonia pressure and also the presence
of nitrogen bonded to carbon in different configurations (simple, dou
ble and/or triple bonds) was observed. The use of guanazole targets le
ads to higher efficiency in the nitrogen incorporation and in the form
ation of simple C-N bonds.