R. Brendel et al., MONOCRYSTALLINE SI WAFFLES FOR THIN SOLAR-CELLS FABRICATED BY THE NOVEL PERFORATED-SILICON PROCESS, Applied physics A: Materials science & processing, 67(2), 1998, pp. 151-154
We apply the novel perforated-silicon process (''psi-process'') for th
e fabrication of thin (a few microns thick) monocrystalline silicon la
yers for solar cells with textured surfaces for efficient light trappi
ng. A silicon layer grows epitaxially on the porous surface of a textu
red monocrystalline Si substrate. Mechanical stress splits the porous
layer and thereby separates the epitaxial layer from the substrate. X-
ray diffraction analysis proves monocrystallinity for our 5.8-mu m-thi
ck Si layer. Ray tracing simulations correctly model the optical refle
ctance measurements. The simulations predict a maximum short-circuit c
urrent of 36.5 mA/cm(2) for this waffle-shaped film when it is attache
d to glass substrates.