L. Thome et al., FORMATION OF METALLIC NANOPHASES IN SILICA BY ION-BEAM MIXING PART II- CLUSTER FORMATION, Applied physics A: Materials science & processing, 67(2), 1998, pp. 241-247
The formation of Ag nanoclusters in a SiO2 matrix by ion-beam mixing o
f SiO2/Ag multilayers is studied via Rutherford backscattering spectro
metry, optical absorption, and transmission electron microscopy experi
ments. In a first step, irradiation with MeV heavy ions transforms the
continuous Ag layers into a string of micrometer-sized Ag inclusions.
This mechanism can be attributed to lateral segregation of metallic a
toms induced by irradiation. In a second step, the Ag inclusions are b
roken up by incoming ions and Ag nanoclusters are formed by agglomerat
ion of mobile Ag atoms. The latter mechanism is likely due to a combin
ation of ballistic mixing and radiation-induced segregation or radiati
on-enhanced diffusion processes. The size of the metallic nanoclusters
formed depends also on the irradiation temperature.