THE CONDUCTIVE BEHAVIOR AND STRUCTURAL CHARACTERISTICS IN THE I-BEAM-IMPLANTED LAYER OF PLASMA-POLYMERIZED PYRROLE FILM()

Authors
TONG ZS WU MZ PU TS ZHANG ZY ZHANG J JIN RP ZHU DZ ZHU FY CAO DX CAO JQ
Citation
Zs. Tong et al., THE CONDUCTIVE BEHAVIOR AND STRUCTURAL CHARACTERISTICS IN THE I-BEAM-IMPLANTED LAYER OF PLASMA-POLYMERIZED PYRROLE FILM(), Journal of applied polymer science, 69(9), 1998, pp. 1743-1751
Citations number
26
Categorie Soggetti
Polymer Sciences
Journal title
Journal of applied polymer science → ACNP
ISSN journal
00218995
Volume
69
Issue
9
Year of publication
1998
Pages
1743 - 1751
Database
ISI
SICI code
0021-8995(1998)69:9<1743:TCBASC>2.0.ZU;2-S
Abstract
A dense organic film was prepared by plasma polymerization of pyrrole. A 20 keV I+ implantation at a fluence of 1 x 10(16) ions cm(-2) was u sed to produce a conducting surface layer due to doping. The character istics of the implanted layer have been investigated using ion beam an alysis techniques, X-ray photoelectron spectroscopy, and near-infrared to ultraviolet spectroscopy. The charge carriers transport in this im planted layer was also analyzed in the temperature region of 120 to 29 7 K. (C) 1998 John Wiley & Sons, Inc. J Appl Polym Sci 69: 1743-1751, 1998.