STRUCTURAL CHARACTERIZATION OF VARIOUS CHIRAL SMECTIC-C PHASES BY RESONANT X-RAY-SCATTERING

Citation
P. Mach et al., STRUCTURAL CHARACTERIZATION OF VARIOUS CHIRAL SMECTIC-C PHASES BY RESONANT X-RAY-SCATTERING, Physical review letters, 81(5), 1998, pp. 1015-1018
Citations number
22
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
81
Issue
5
Year of publication
1998
Pages
1015 - 1018
Database
ISI
SICI code
0031-9007(1998)81:5<1015:SCOVCS>2.0.ZU;2-W
Abstract
We report the results of resonant x-ray diffraction at the sulfur K-ed ge performed upon free-standing films of a thiobenzoate liquid-crystal compound. Our data provide the first direct structural evidence of di stinct periodicities in several chiral Sm-C phases, including 2-layer, 3-layer, and 4-layer superlattices in Sm-C-A, Sm-C-FI1*, and Sm-C-FI 2, respectively. In Sm-C-alpha*, periodicity incommensurate with the layer spacing was detected. The racemic compound version was also stud ied. The results are consistent with a ''clock model'' of the Sm-C va riant structures.