DYNAMIC ANALYSIS OF V-TRANSMISSION-LINES

In this work, a dynamic analysis of the V line is presented. Previous work analyzed the performance of this structure for low frequency appl ications using quasistatic approximations. Here, we extend the analysi s of the V line into the higher frequency range where dispersion becom es significant and where it cannot be predicted by quasistatic methods . We show that the V line provides features and advantages that are no t present in the conventional microstrip structures, most notably the appreciable decrease in coupling between adjacent lines in comparison with the conventional microstrip structure, This feature makes the V l ine well suited for high packaging density applications. The full-wave analysis is carried out using a Yee-cell based finite-difference time -domain (FDTD) method, while enforcing a highly efficient and stable m esh truncation technique. Results are presented for a single and multi conductor structures.