HIGH-RESOLUTION MONOCHROMATIC X-RAY-IMAGING SYSTEM BASED ON SPHERICALLY BENT CRYSTALS

Citation
Y. Aglitskiy et al., HIGH-RESOLUTION MONOCHROMATIC X-RAY-IMAGING SYSTEM BASED ON SPHERICALLY BENT CRYSTALS, Applied optics, 37(22), 1998, pp. 5253-5261
Citations number
38
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
37
Issue
22
Year of publication
1998
Pages
5253 - 5261
Database
ISI
SICI code
0003-6935(1998)37:22<5253:HMXSBO>2.0.ZU;2-H
Abstract
We have developed an improved x-ray imaging system based on sphericall y curved crystals. It is designed and used for diagnostics of targets ablatively accelerated by the Nike KrF laser. A spherically curved qua rtz crystal (2d = 6.687 Angstrom, R = 200 mm) has been used to produce monochromatic backlit images with the He-like Si resonance line (1865 eV) as the source of radiation. The spatial resolution of the x-ray o ptical system is 1.7 mu m in selected places and 2-3 mu m over a large r area. Time-resolved backlit monochromatic images of polystyrene plan ar targets driven by the Nike facility have been obtained with a spati al resolution of 2.5 mu m in selected places and 5 mu m over the focal spot of the Nike laser. (C) 1998 Optical Society of America.