INTEGRATING HIGH-RESOLUTION REFRACTION DATA INTO NEAR-SURFACE SEISMIC-REFLECTION DATA-PROCESSING AND INTERPRETATION

Citation
Kc. Miller et al., INTEGRATING HIGH-RESOLUTION REFRACTION DATA INTO NEAR-SURFACE SEISMIC-REFLECTION DATA-PROCESSING AND INTERPRETATION, Geophysics, 63(4), 1998, pp. 1339-1347
Citations number
25
Categorie Soggetti
Geochemitry & Geophysics
Journal title
ISSN journal
00168033
Volume
63
Issue
4
Year of publication
1998
Pages
1339 - 1347
Database
ISI
SICI code
0016-8033(1998)63:4<1339:IHRDIN>2.0.ZU;2-A
Abstract
Shallow seismic reflection surveys commonly suffer from poor data qual ity in the upper 100 to 150 ms of the stacked seismic record because o f shot-associated noise, surface waves, and direct arrivals that obscu re the reflected energy. Nevertheless, insight into lateral changes in shallow structure and stratigraphy can still be obtained from these d ata by using first-arrival picks in a refraction analysis to derive a near-surface velocity model. We have used turning-ray tomography to mo del near-surface velocities from seismic reflection profiles recorded in the Hueco Bolson of West Texas and southern New Mexico. The results of this analysis are interval-velocity models for the upper 150 to 30 0 m of the seismic profiles which delineate geologic features that wer e not interpretable from the stacked records alone. In addition, the i nterval-velocity models lead to improved time-to-depth conversion; whe n converted to stacking velocities, they may provide a better estimate of stacking velocities at early traveltimes than other methods.