The electroluminescence (EL) of Tb3+-doped anodic Ta2O5 films in the p
resence of H2O2 was studied. Since the EL of the dopant Tb3+ ion shows
the same potential (U) dependence as the background EL, light emissio
n from Tb3+ can be used to monitor electrochemical processes at the ox
ide/solution interface. In the rising part of the (EL,U) curve, both t
he hole injection rate and the radiative recombination efficiency incr
ease. This gives rise to a quadratic dependence of the intensity on th
e current. The EL is not influenced by the rotation rate; ring-disk ex
periments show the hole injection current to be kinetically limited. A
t more negative potential, quenching of the emission occurs. Compariso
n of the photoluminescence (PL) and EL intensities and spectra, which
depend on the surroundings of the Tb3+ ion, indicates that the quenchi
ng must be due to incorporation of hydrogen from the oxide/solution in
terface. The anodic dark current resulting from cathodic polarization
can be used as a measure of the concentration of the H-induced recombi
nation centers.