Normal and off-normal photoemission experiments are performed with He
I radiation on a GaSb(110) surface using a fast photoelectron analyzer
. The results are compared with volume and surface electronic structur
es calculated by the tight-binding method. Care is taken to distinguis
h true surface emissions from diffracted secondary emissions, also cal
led ''umklapp'' emissions. The umklapp bands can be followed in off-no
rmal data with continuous variations which have not previously been ob
served. Surface states at the top of the valence band and surface reso
nances have been recognized. The tight-binding calculation of the ener
gy dispersion of the umklapp bands confirms the allocation of these em
issions (called S-1 and S-2). They seem very similar to those already
reported for other group III-V compounds. (C) 1998 Elsevier Science B.
V. All rights reserved.