F. Iida et al., OPTICAL-PROPERTIES OF MBE-GROWN ZNTE ON GAAS - EFFECTS OF A ZNSE BUFFER LAYER, Physica status solidi. a, Applied research, 139(2), 1993, pp. 531-539
Effects of a ZnSe buffer layer on the optical properties in ZnTe on Ga
As grown by molecular beam epitaxy (MBE) are investigated by photolumi
nescence (PL) and Raman scattering. From PL results an improvement of
crystallinity of ZnTe films is recognized as the thickness of the ZnSe
buffer layer increases. This is explained well by an exponential incr
ease of the ratio of neutral acceptor-exciton complex to deep level em
ission with increasing ZnSe buffer layer thickness. Raman scattering r
esults show an elongation of the ZnSe lattice by expansion due to acco
modation of the ZnTe lattice. The large critical thickness of ZnTe/ZnS
e is estimated experimentally to be about 30 nm in MBE growth on GaAs
because of similar electronegativity in growth of ZnTe on ZnSe. The re
sult obtained from the temperature dependence of LO phonon frequencies
supports also an expansion of the ZnSe lattice obtained by Raman scat
tering.