Hm. Taylor et De. Sweitzer, ON THE CURRENT ENHANCEMENT AT THE EDGE OF A CRACK IN A LATTICE OF RESISTORS, Advances in Applied Probability, 30(2), 1998, pp. 342-364
Consider a network whose nodes are the integer lattice points and whos
e arcs are fuses of 1 Omega resistance. Remove a horizontal segment of
N adjacent vertical arcs, forming a 'crack' of length N. Subject the
network to a uniform potential gradient of upsilon volts per are in th
e north-south (or vertical) direction and measure the current in one o
f the two vertical arcs at the ends of the crack. We write this curren
t in the form e(N)upsilon, and call e(N) the current enhancement. We s
how that the enhancement grows at a rate that is the order of the squa
re root of the crack length. Our method is to identify the enhancement
with the mean time to exit an interval for a certain integer valued r
andom walk, and then to use some of the well-known Fourier methods for
studying random walk. Our random walk has no mean or higher moments a
nd is in the domain of attraction of the Cauchy law. We provide a good
approximation to the enhancement using the explicitly known mean time
to exit an interval for a Cauchy process. Weak convergence arguments
together with an estimate of a recurrence probability enable us to sho
w that the current in an intact fuse, that is in the interior of a cra
ck of length N, grows proportionally with Nl log N.