SILICIDE FORMATION BY HIGH-TEMPERATURE REACTION OF RH WITH MODEL SIO2-FILMS

Citation
S. Labich et al., SILICIDE FORMATION BY HIGH-TEMPERATURE REACTION OF RH WITH MODEL SIO2-FILMS, The Journal of chemical physics, 109(6), 1998, pp. 2052-2055
Citations number
17
Categorie Soggetti
Physics, Atomic, Molecular & Chemical
ISSN journal
00219606
Volume
109
Issue
6
Year of publication
1998
Pages
2052 - 2055
Database
ISI
SICI code
0021-9606(1998)109:6<2052:SFBHRO>2.0.ZU;2-L
Abstract
The metal-support interaction between rhodium and silica has been stud ied by x-ray photoelectron spectroscopy for a Rh/SiO2/Mo model system. This system consists of a thin silicon oxide layer, prepared by chemi cal vapor deposition on molybdenum with a nominal load of one monolaye r rhodium, Heating in ultrahigh vacuum (UHV) results in changes of the cluster size and binding energies of surface species. Thermal treatme nts above 850 K in UHV results in the formation of a rhodium silicide, Rh3Si, which has not been reported so far. For the formation of this new phase a surface reaction mechanism is proposed. (C) 1998 American Institute of Physics..