INVESTIGATION OF BULK AND INTERFACIAL PROPERTIES OF BA0.5SR0.5TIO3 THIN-FILM CAPACITORS

Authors
ZAFAR S JONES RE CHU P WHITE B JIANG B TAYLOR D ZURCHER P GILLEPSIE S
Citation
S. Zafar et al., INVESTIGATION OF BULK AND INTERFACIAL PROPERTIES OF BA0.5SR0.5TIO3 THIN-FILM CAPACITORS, Applied physics letters, 72(22), 1998, pp. 2820-2822
Citations number
5
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
72
Issue
22
Year of publication
1998
Pages
2820 - 2822
Database
ISI
SICI code
0003-6951(1998)72:22<2820:IOBAIP>2.0.ZU;2-8
Abstract
In this letter, we report the results for capacitance versus frequency measurements on a set of Ba0.5Sr0.5TiO3 (BST) capacitors with platinu m electrodes (Pt) and varying BST film thicknesses. The study shows th :lt Pt/BST interfacial capacitance is independent of frequency whereas the bulk dielectric constant has a power law dependence on frequency. Also, the bulk dielectric constant is observed to decrease whereas th e interfacial capacitance increases with increasing temperature. In ad dition, we report the dependence of dielectric dispersion on BST film thickness and temperature. Calculations are performed which provide in sights into the observed dispersion effects. (C) 1998 American Institu te of Physics.