Auger electron spectroscopy has been used as an in sial diagnostic in
ultrahigh vacuum studies of diamond nucleation and growth on silicon.
It is demonstrated that sp(3)-bonded carbon can be formed under ultrah
igh vacuum conditions in the absence of excess hydrogen using a Aux of
C2H4 molecules. For the conditions reported here, a silicon adlayer i
s always present on the surface of the growing thin film. The presence
of this adlayer suggests that the formation of sp(3)-bonded carbon oc
curs by a surfactant mediated process. Specifically, silicon is though
t to maintain the template for sp(3)-carbon growth by minimizing the s
urface free energy for this structure. Further, the silicon adlayer is
thought to enhance the growth kinetics of sp(3) carbon by providing a
more reactive growth surface than a hydrogen-terminated carbon surfac
e. (C) 1998 American Institute of Physics. [S0003-6951 (98)04928-6].