FOCUSED ION-BEAM FABRICATION OF FIBER PROBES WITH WELL-DEFINED APERTURES FOR USE IN NEAR-FIELD SCANNING OPTICAL MICROSCOPY

Authors
PILEVAR S EDINGER K ATIA W SMOLYANINOV I DAVIS C
Citation
S. Pilevar et al., FOCUSED ION-BEAM FABRICATION OF FIBER PROBES WITH WELL-DEFINED APERTURES FOR USE IN NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Applied physics letters, 72(24), 1998, pp. 3133-3135
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
72
Issue
24
Year of publication
1998
Pages
3133 - 3135
Database
ISI
SICI code
0003-6951(1998)72:24<3133:FIFOFP>2.0.ZU;2-F
Abstract
We present a focused ion-beam (FIB) fabrication method for very clean and well-defined subwavelength fiber probes with metallic apertures of a desired diameter for use in near-field scanning optical microscopy. Such probes exhibit improved features compared to probes coated with metal by the conventional angled evaporation technique. Examples of FI B fabricated fiber probes are shown and images of a test sample are pr esented using one of the probes in a near-field microscope. (C) 1998 A merican Institute of Physics.