G. Rutsch et al., MEASUREMENT OF THE HALL SCATTERING FACTOR IN 4H AND 6H SIC EPILAYERS FROM 40 TO 290 K AND IN MAGNETIC-FIELDS UP TO 9 T, Journal of applied physics, 84(4), 1998, pp. 2062-2064
The Hall scattering coefficient r(H) determines the relationship betwe
en the measurable Hall coefficient R-H and the free carrier concentrat
ion. Reliable knowledge of r(H) is necessary for the precise interpret
ation of Hall measurements and to validate theoretical transport calcu
lations. We have measured the Hall scattering factor in nitrogen doped
4H and 6H epitaxial layers from 35 to 290 K in magnetic fields up to
9 T. The effective Hall scattering factor varies between 0.91 and 1.21
in 4H SiC and 0.84 and 1.02 in 6H SiC. The effect of the Hall scatter
ing factor on dopant activation energies obtained from Hall measuremen
ts is not large enough to explain the difference between dopant activa
tion energies obtained from Hall effect and infrared absorption measur
ements. (C) 1998 American Institute of Physics. [S0021-8979(98)01516-3
].