Ls. Yu et al., THE ROLE OF THE TUNNELING COMPONENT IN THE CURRENT-VOLTAGE CHARACTERISTICS OF METAL-GAN SCHOTTKY DIODES, Journal of applied physics, 84(4), 1998, pp. 2099-2104
The temperature dependence of the current-voltage characteristics of N
i-GaN Schottky barriers have been measured and analyzed. It was found
that the enhanced tunneling component in the transport current of meta
l-GaN Schottky barrier contacts is a likely explanation for the large
scatter in the measured Richardson constant. (C) 1998 American Institu
te of Physics. [S0021-8979(98)01316-4].