CONTACT ELECTRIFICATION STUDIES USING ATOMIC-FORCE MICROSCOPE TECHNIQUES

Citation
B. Gady et al., CONTACT ELECTRIFICATION STUDIES USING ATOMIC-FORCE MICROSCOPE TECHNIQUES, Journal of applied physics, 84(1), 1998, pp. 319-322
Citations number
33
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
84
Issue
1
Year of publication
1998
Pages
319 - 322
Database
ISI
SICI code
0021-8979(1998)84:1<319:CESUAM>2.0.ZU;2-E
Abstract
Contact electrification measurements using atomic force microscopy tec hniques were performed using micrometer-sized spheres made of polystyr ene and flat substrates of either freshly cleaved, highly oriented pyr olytic graphite (HOPG) or a 0.2-mu m-thick Au[lll] film grown on mica. The polystyrene/HQPG interaction exhibited significant electrostatic charging when compared to the polystyrene/Au system. This result is co nsistent with qualitative expectations of contact charging based on a triboelectric series of common materials. The observed contact electri fication is also consistent: with electronic charge transfer between m aterials, rather than an ionic dr material transfer mechanism. (C) 199 8 American Institute of Physics.