OPTICAL-INTENSITY OF LIGHT IN LAYERS OF SILICON WITH REAR DIFFUSE REFLECTORS

Authors
Citation
Je. Cotter, OPTICAL-INTENSITY OF LIGHT IN LAYERS OF SILICON WITH REAR DIFFUSE REFLECTORS, Journal of applied physics, 84(1), 1998, pp. 618-624
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
84
Issue
1
Year of publication
1998
Pages
618 - 624
Database
ISI
SICI code
0021-8979(1998)84:1<618:OOLILO>2.0.ZU;2-X
Abstract
Light trapping is essential to the performance of thin-layer polycryst alline silicon solar cells. One relatively new method of light trappin g is the use of textured or pigmented dielectric layers on the rear su rface which diffuse and reflect light reaching the rear surface. This article presents a one-dimensional optical model of thin silicon solar cells with such rear diffuse dielectric reflectors. Experimental fron t reflectance measurements and ray tracing simulations of thin, planar silicon layers with rear diffuse dielectric rear reflectors are prese nted and compared to the model with good agreement. Finally, an expres sion for the upper limit of the optical enhancement factor is develope d for this type of light trapping. (C) 1998 American Institute of Phys ics.