J. Koskinen et al., EFFECT OF DEPOSITION TEMPERATURE AND GROWTH-RATE ON THE BOND STRUCTURE OF HYDROGEN FREE CARBON-FILMS, Journal of applied physics, 84(1), 1998, pp. 648-650
The effect of deposition temperature and growth rate on the bond struc
ture of hydrogen free carbon films has been investigated. A sharp tran
sition temperature of the sp(3) content of the carbon films as a funct
ion of deposition temperature has been reported several times. The val
ue of this transition temperature has varied from 150 to about 300 deg
rees C depending on the growth mechanism. In this article, high values
varying from 300 to 400 degrees C for the transition temperature are
reported. High momentary growth rates of up to 2000 nm/s have been obt
ained by using pulsed vacuum are deposition. The transition temperatur
e has been observed to depend on the momentary growth rate of the carb
on film. The transition has been explained to be a relaxation process
which includes diffusion of carbon atoms at the near surface. The resu
lts have been analyzed by using a model which was originally developed
for radiation enhanced diffusion. An activation energy of 0.65 eV was
obtained. The model also predicts qualitatively the transition temper
atures in the case of the lower deposition rates reported in literatur
e. For the frequency factor of the diffusion coefficient a value of th
e order of 10(-8) Cm-2/s was obtained. (C) 1998 American Institute of
Physics.