Liquid helium droplets of initial mean cluster size, [N], ranging from
600 to 8000 atoms are; doped with argon using the pick-up technique.
The doped clusters are ionized by electron impact, and the resulting f
ragment ions are monitored as a function of argon pressure in the pick
-up volume. Analysis of the pressure dependent ion signals is used to
determine (1) the probability for charge transfer from He+ to the Ar a
toms within the droplet, and (2) the probability for fragmentation of
the Ar-k subclusters upon ionization. The measured charge transfer pro
bability from He+ to Ar ranges from 0.05+/-0.02 for clusters of mean o
riginal size [N] = 8000 to 0.26+/-0.05 for [N] = 600. Charge transfer
to the Ar-k constituent results in the following qualitative trends; a
single Ar atom yields HenAr+ ions; Ar-2 mainly yields Ar-2(+), and Ar
-3 mainly fragments to yield Ar-2(+). Simulations of the results are p
erformed to extract information on how the charge transfer and fragmen
tation processes within the ionized droplet dependent on the size of t
he helium droplet and the number of argon atoms captured. We use the p
ositive-hole resonant-hopping mechanism to determine that the He+ hops
3-4 times prior to localization with either the Ar dopant or another
He atom to form He-2(+). This corresponds to a time scale for He-2(+)
formation of 60-80 fs. (C) 1998 American Institute of Physics.