TRANSMISSION ELECTRON-MICROSCOPY AND CATHODOLUMINESCENCE STUDIES OF EXTENDED DEFECTS IN ELECTRON-BEAM-PUMPED ZN1-XCDXSE ZNSE BLUE-GREEN LASERS/

Citation
Jm. Bonard et al., TRANSMISSION ELECTRON-MICROSCOPY AND CATHODOLUMINESCENCE STUDIES OF EXTENDED DEFECTS IN ELECTRON-BEAM-PUMPED ZN1-XCDXSE ZNSE BLUE-GREEN LASERS/, Journal of applied physics, 83(4), 1998, pp. 1945-1952
Citations number
26
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
83
Issue
4
Year of publication
1998
Pages
1945 - 1952
Database
ISI
SICI code
0021-8979(1998)83:4<1945:TEACSO>2.0.ZU;2-Z
Abstract
We report on studies of extended defects in electron-beam-pumped Zn1-x CdxSe/ZnSe blue and blue-green laser structures. To establish a direct correlation between the local luminescence properties and the presenc e of structural defects, the same thin foil samples were sequentially examined by transmission electron microscopy (TEM) and cathodoluminesc ence (CL) microscopy. The majority of the non-radiative defects were f ound to have one or more threading dislocations in their vicinity. Sta cking faults, as a rule, did not give rise per se to non-radiative rec ombination centers. In several instances we observed nonradiative defe cts by CL with no extended defect counterparts in TEM. (C) 1998 Americ an Institute of Physics.